BIT FOR INTELLIGENT SYSTEM DESIGN
The increasing complexity of microelectronic circuitry, as witnessed by multi-chip modules and system-on-a-chip and the rapid growth of manufacturing process automation require, that more effective and efficient testing and fault diagnosis techniques be developed to improve system reliability, reduce system downtime, and esemnhance productivity. As a design philosophy, built-in-test (BIT) is receiving increasing attention from the research community. This paper presents an overview of BIT search in several areas of industry, including semiconductor, manufacturing.
The increasing complexity of microelectronic circuitry, as witnessed by multi-chip modules and system-on-a-chip and the rapid growth of manufacturing process automation require, that more effective and efficient testing and fault diagnosis techniques be developed to improve system reliability, reduce system downtime, and esemnhance productivity. As a design philosophy, built-in-test (BIT) is receiving increasing attention from the research community. This paper presents an overview of BIT search in several areas of industry, including semiconductor, manufacturing.
